Reverberant chambers

Shielded chambers

Gtem Cells

Semi-anechoic Chambers

EMC Antennas

Wi-Fi Antennas


 


TEM1000TEM200

Transverse Electro-Magnetic (TEM) cell or Crawford cell (named after its inventor) is used to generate accurate electromagnetic waves over a wide frequency range: DC (0 Hz) to GHz. EM waves generated in the cell propagate in transverse mode and have the same characteristics as a plane wave. It can be used to calibrate E-field broadband probes for testing radiated E-field immunity as well as for measuring radiated emission from a product with a spectrum analyzer/EMI receiver.TEM cell generates a consistent electromagnetic field for testing small RF devices such as wireless pagers, receivers, portable phones, etc. An external test signal applied through the input port of the TEM cell generates a consistent and predictable (plane wave) test field inside the TEM cell. The radiation field emanating from a device (under test) located in the cell can also be detected through the signal generator port connected to an EMI receiver or a spectrum analyzer. The Equipment Under Test (EUT) is placed on the bottom ground plane as in Open Area Test Site (OATS) and in accordance with the shielded enclosure conditions. TEM cells are used in final compliance certification tests. There IEC 61000-4-3  EMC standard requires a TEM cell for radiated susceptibility and radiated emission tests. Integrated Circuits (IC), Micro-Electro-Mechanical Systems (MEMS) devices and PCBs can also be tested according to the standard SAE J1752-3 .  TEM cells can deliver an equivalent OATS performance inside the comforts of a lab with minimum OATS errors. The main advantage of a TEM cell over a strip-line is that in the former, the EUT is completely shielded (except a window to insert/monitor the EUT) from the external environment, thus producing results with negligible errors. It is one of the reasons why a TEM cell is qualified to perform final compliance tests.

Technical Specifications TEM 200 TEM 500 TEM 1000 TEM 3000
Frequency range DC-200 MHz DC-500 MHz DC-1GHz DC-3GHz
Height under the plate 27 cm 14,7cm 7,3cm 2,35cm
Dimensions (LxWxH) 205x97x58cm 107x51x33,5cm 54x45x18cm 15x8x6cm
Max. Input power 1,6KW long term 1KW long term 750W long term 400W long term
The field for a 25W amplifier 118V/m 350V/m 475V/m 1,4KV/m
Impedance 50 ohm 50 ohm 50 ohm 50 ohm
VSWR <1.1 <1.2 <1.2 <1.2
Return Loss >25dB >20dB >20dB >20dB
Connector type N or 7/16″ optional N N N or TNC, SMA
Weight Approx. 40Kg Approx. 20Kg. Approx. 4,8Kg. Approx. 1,6Kg.
Options Signal and power supply filter, Dummy Load: on demand
* Can be equipped with a test setup for IC or PCB acc. to SAE J1752-3

ApexTEM1000Trolley for OTEM200. OTEM500

TEM 3000  – TEM6000

 Download – TEM Cell

TEM-3000, TEM-6000  STRIPLINE  Ic Testing

TEM3000 and TEM6000 Striplines are 3GHz and  6 GHz IC Stripline TEM Cell to generate EM fields for testing sample IC devices. They meet the requirements of IEC 61967-2/8, IEC 62132-8, and SAE 1752-3.

MARKETS: Automotive, CE Mark (Industrial & Residential), Components, Industrial, INFORMATION TECHNOLOGY, Medical Electronics, Military, Power Generation, RF, Wireless/Telecom,

TEST Standards
IEC 62132-8 : 2012 Integrated circuits – Measurement of electromagnetic immunity, 150 kHz up to 3 GHz – Part 8: Measurement of radiated immunity – IC stripline method
IEC 61967-2 : 2005 Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 2: Measurement of radiated emissions – TEM cell and wideband TEM cell method
IEC 61967-8 : 2011 Integrated circuits – Measurement of electromagnetic emissions, 150 kHz up to 3 GHz – Part 8: Measurement of radiated emissions – IC stripline method
SAE 1752-3 Measurement of Radiated Emissions from Integrated Circuits — TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)
Electromagnetic Radiation test of IC
Electromagnetic Immunity test of IC

Description

TEM-6000 STRIPLINE Mod.2020 is a DC-6 GHz IC Stripline TEM Cell for testing small devices such as IC’s, wireless communication modules, etc. An external test signal applied through the input port of the TEM-6000 STRIPLINE Mod.2020 generates a consistent and predictable TEM test field inside the cell. The radiation field from a device transmitting in the Cell can also be detected through the port using a test receiver. Requires 50Ω load for termination.

The high-quality compact design is optimized for measurements beyond the standard TEM Cell frequency range to 6 GHz. The E-H field inside the test volume is proportional to the input voltage and inversely proportional to the cell height. Since this apparatus is very broadband, it has many applications in the area of EMI, EMS, receiver sensitivity test, etc.

Features:

  • Up to 6 GHz bandwidth (Beyond normal TEM Cell bandwidth of 1 GHz)
  • Can handle up to 5 kV high voltage pulse for Transient Field Injection Test

Frequency range DC – 3GHz, DC- 6 GHz
TEM Cell Impedance 50Ω ± 5% nominal
VSWR DC- 3 GHz  <1.2
3 – 5 GHz <1.5
5 – 6 GHz <1.9
Insertion Loss (S21) Less than 0,2dB
Return Loss (S11 & S22) DC- 3 GHz  >20 dB
3 – 5 GHz >14 dB
5 – 6 GHz >10 dB
RF Connectors N-Type up to 3GHz, and SMA up to 6GHz
Maximum Input Power 500 Watts up 3GHz, 200W up to 6GHz
Maximum Input Voltage 3 kV @DC,  5kV @Pulse
Effective Cell Height 30 mm up to 3GHz and 12.5 mm up to 6GHz
DUT Port Dimensions 80(W)x80(D) and 50 (W) x 50 (D) mm
Recommended MAX DUT Dimensions 30 (W) x 30(W) x 3(H) mm
TEM Cell Dimensions 170 (W) x 120 (D) x 70 (H) mm;6.5 (W) x 4.5 (D) x 1 in.
Weight Approx 2 kg;4 lbs.

TEM6000

DTEM 3000

 Dual TEM Cell (DTEM)

Dual TEM Cell test fixture is the only one that can separate the electric and magnetic field couples. Both the near-field and the far-field measurements can also be measured by this technique. The Dual TEM Cell System consists of two TEM cells, coupled through an aperture. The system has four ports as shown and numbered in Figure 1.

Fig.1

The source is connected to the driving cell at port 1 terminated at 50 Ohm with port 4. Ports 2 and 3 are on the sensing cell. Port 2 is on the same end as port 1. The Dual TEM Cell System allows studying the electric and magnetic field couplings separately because of having two receiving ports.

The source is connected to the driving cell at port 1 terminated at 50 Ohm with port 4. Ports 2 and 3 are on the sensing cell. Port 2 is on the same end as port 1. The Dual TEM Cell System allows studying the electric and magnetic field couplings separately because of having two receiving ports. The TEM cell consists of a section of rectangular coaxial transmission line (RCTL) with two tapered sections at each ends. The taper is used as a transition to match the RCTL to standard coaxial cable characteristic impedance connectors at the two ports of the cell. The center inner conductor, consisting of a tin metallic septum, is fixed by two dielectric supports. The cell is used as a broadband amplitude and phase linear transducer of RF signals into field strengths. The field inside the cell is uniform and so it is a good approximation to simulate a plane wave in open space (far-field). Since the TEM cell operates in the bi-directional mode it is assumed that two cells coupled through a common aperture may be used as a radiated field measurement system. The coupling between cells through their common aperture yields the basic result which the dual-cell correct operation relies on. Providing the upper side of the TEM cell with an aperture, the generated field, which is known and uniform, couples into a second similar above-standing cell. When mounting the shielding material sample on the aperture, the coupling between the source cell and the transducing one is reduced. The amount of this coupling reduction is a direct measure of the shielding effectiveness of the sample material under test.

The measurement system is made up with:

Both cells are terminated on their characteristic impedance to ensure a low VSWR level and to allow for the TEM mode propagation only. An automated PC-based control system handles both exchanging transmissions between instruments and data collection.

                                                                            

                                         VSWR                                    DTEM dynamic range [dB] measured with

                                                                                             0 dBm input, 1 kHz RES BW

 

DTEM1000

Shielding Effectiveness Definitions

The measurement has a substituting approach and therefore is performed through two phases: In the first phase, called the calibration phase, the transduced signal power level is measured in a free aperture condition;

in the second phase, the same measurement is accomplished by mounting the sample on the aperture. The shielding effectiveness (SE) is so defined as:

SE = 10 Log A/B

where:

A = signal power level measured without the test sample

B = signal power level measured with the test sample mounted

OPEN TEM CELL

Open TEM-cells are well suited for immunity testing of small objects according to European (CE) and automotive standards (SAE J1113-25) or for biological experiments. The advantage of these O-TEM cells is that they are open and it is very easy to control the functions of the EUT (Equipment Under Test). The applications are for instance the immunity testing of watches, pagers, telephones or PCB’s. In comparison with other closed TEM-cells, the price is low. The field decreases rapidly outside the Open TEM-cells (approx. 33 dB at 1 meter) and it is, therefore, possible to use an Open TEM-cell in ordinary facilities. Another interesting application is the calibration of field probes as the generated field inside the Open TEM-cell is very exact. Open TEM-cells are the most precise structures for field calibrations.

Technical Specifications O-TEM 200 O-TEM 500 O-TEM 1000 O-TEM 3000
Frequency range DC-200 MHz DC-500 MHz DC-1GHz DC-3GHz
Height under the plate 32,7 cm 14,7cm 7,3cm 2,5cm
Dimensions (LxWxH) 247x114x70cm 107x51x33,5cm 54x45x16,8cm 44x18x8cm
Max. Input power 1,5KW long term 1KW long term 750W long term 400W long term
The field for a 25W amplifier 105V/m 215V/m 480V/m 1,4KV/m
Impedance 50 ohm 50 ohm 50 ohm 50 ohm
Wave impedance 377 Ω 377 Ω 377 Ω 377 Ω 377 Ω
Connector type N or 7/16″ optional N N N or TNC, SMA
VSWR <1.1 <1.2 <1.2 <1.9
Field precision ± 5 % ± 5 % ± 5 % ± 5 %
Weight Approx. 55Kg Approx. 12Kg. Approx. 3,5Kg. Approx. 3Kg.
Options Signal and power supply filter, Dummy Load: on demand
* Can be equipped with a test setup for IC or PCB acc. to SAE J1752-3

OPEN TEM 200OPEN TEM 500

OTEM500 movie

Download OPEN TEM Cells

SAE Frames option

 

 

Automotive TEM filters